PH Department Silicon Facility

Silicon Lab 

 
Equipment in bldg. 28
CV/IV measurements at room temperature
  • Labview control

  • Bias up to 1100V

  • CV at 0.1, 1, 10, 100 KHz

  • Probe station with 4 inch chuck in dark box

CCE measurements at low temperatures
  • Sr-90 source, scintillator/PMT trigger

  • amplifier with 2.5 mus shaping (single channel)

  • cooling down to -20C

CCE & TCT measurements at low temperatures (multichannel)
  • bias up to 1100V

  • ALIBAVA system (LHCb Beetle based)

  • wide bandwidth amplifiers (up to 3 channel)

  • front and back illumination of sample

  • 1 GHz Oscilloscope

  • ps lasers (660nm, 1060nm)

  • software (linux,root) for ALIBAVA

  • cooing down to -20C

TCT measurements (single channel)
  • labview control

  • 660 & 1060 nm lasers (1 ns pulse)

  • front and back illumination of sample

  • 500 MHz Oscilloscope

  • wide band width amplifier (single channel)

  • bias up to 1100V

  • cooling down to -10C, dark box, N2 flushed

Contacts:   - Semiconductor lab telephone: 71383
                   - Michael Moll 72495, 164756

14/10/09   (MM)